SD-Vision: A Two-Stage Deep Learning Framework with a Class-Weighted Composite Loss for Automated, Quantitative Assessment of Stink Bug-Damaged Soybean Seeds
High-throughput industrial and agricultural inspection remains critically bottlenecked by the slow, subjective nature of manual classification, resulting in substantial economic losses worldwide. Traditional computer vision methods frequently struggle to scale or accurately isolate irregular, overlapping surface micro-defects.
To overcome these systemic limitations, computer vision researcher Saurav Upadhyaya developed a framework called 'SD-Vision', a two-stage deep learning framework that introduces an original class-weighted composite loss function to automate high-precision quantitative assessments. In this technical session, Saurav will demonstrate how his state-of-the-art architecture successfully orchestrates lightweight localization models alongside Shifted Window (Swin) Transformers to achieve instant, pixel-level injury segmentation.
Key Takeaways:
a) Multi-Stage Neural Orchestration: Concurrently deploying edge-optimized models (YOLOv8n) with advanced best-performing transformer (Swin-Base + UPerNet) for high-speed macro-localization and micro-injury mapping.
b) Mathematical Loss Optimization: Re-engineering a custom composite loss function and a balanced weighting schema to drastically mitigate over-segmentation and false positives.
c) Robust Real-World Deployment: Validating cross-sensor algorithmic resilience to transition complex frameworks from lab environments into real-time applications.
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